Calendar

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iNEMI Optoelectronics TIG and Endface Specification Meeting
at OFC/NFOEC 2008
February 25, 2008
9:00 a.m. - 4:00 p.m. PST
San Diego Convention Center
Room 27A
San Diego, California

Registration

Registration is required for our planning purposes.  Please register by February 20, 2008.

Click here to register.

There will be an iNEMI Optoelectronics TIG Meeting followed by the iNEMI Endface Specification Project Meeting on Monday, February 25, 2008.

Meeting Overview

The iNEMI Optoelectronics Technology Integration Group (TIG) has scheduled its iNEMI Roadmap gap analysis meeting plus a Fiber Connector End-Face Inspection Project meeting to coincide with the optical communications industry's OFC/NFOEC 2008 conference (Feb 24-28, 2008, San Diego Convention Center, San Diego, CA.); for conference information, go to:  http://www.ofcnfoec.org/

The one-day iNEMI meeting is scheduled for Monday, February 25, 2008 at the San Diego Convention Center, San Diego.

In addition, the face-to-face meeting scheduled at the San Diego Convention Center will have teleconference abilities, for those project participants who cannot attend in person. 

Call-in Information
     Toll Free:  1-888-231-5467
     Toll Number:  1-719-955-1389
     Pass Code:  113998

Agenda

9:00 – 9:15 am
     Coffee / Introductions

9:15 – 9:30 am
     Introductions and INEMI Overview: David Godlewski, iNEMI 

iNEMI Fiber Connector End-Face Inspection Project (Phase II)
Project Chair:   Tatiana Berdinskikh, Celestica
Project Co-Chair:  Brian Roche, Cisco Systems

Project Focus:
This project is developing requirements for allowable surface defects, such as scratches, pits, and contamination.  Based on experimental data and the results of mathematical modeling, the group plans to define the zone criteria and pass/fail visual requirements for polished connectors, single mode and multimode fiber.

9:30 – 10:00 am
     Development of cleanliness specifications for Single-Mode, Angled Physical Contact MT connectors
     Tatiana Berdinskikh, Celestica International Inc., Mike Hughes, US Conec Ltd., Sun-Yuan Huang, Intel Corp.

10:00 – 10:30 am
     Correlation study between contamination and signal degradation in Single-Mode APC connectors
     Steve Lytle, JDS Uniphase

10:30 – 11:00 am
     Updates on the IEC standard IEC 61300-3-35 “Examinations and measurements - Fibre optic cylindrical connector endface visual and automated inspection
     Steve Lytle, JDS Uniphase

11:00 - 11:30 am
     Single-Mode Fiber Optic Connectors in FTTX:  Status and Issues
     Steve Zimmel, ADC

11:30 – 12:30 pm
     Break

12:30 – 1:00 pm
     Transceiver optics design and receptacle inspection criteria,
     Christine Chen, Avago Technologies

1:00 – 1.30 pm
     Automatic measurement of contamination on lens-based optical devices
     Douglas H. Wilson, PVI Systems Inc.

1:30 – 2:00 pm
     Design of Experiment (DOE) and modeling of optical performance of ROSA devices
     Douglas H. Wilson, PVI Systems; Christine Chen, Avago Technologies, Yutaka Sadohara, Sumitomo Electric

2:00 – 2:30 pm
     Vitro-stub receptacle; Optical performance under dusty conditions
     Chisami Ishida, Toto

2:30 – 2:50 pm
     Coffee break

2:50 – 3:10 pm
     The Need for a Single Cleaning Procedure for All Types of Soils in FITx: OEM and OSP
     Ed Forrest

3:10 – 3:30 pm
     Review the iNEMI Optoelectronics Technology Roadmap
     David Godlewski, iNEMI

3:30 – 4:00 pm
     Discuss industry needs and potential new projects to address those needs, open discussion
     All

All meetings are open to anyone interested in attending.

Registration

Registration is required for our planning purposes.  Please register by February 20, 2008.

Click here to register.

For further information, contact:
David Godlewski
dgodlewski@inemi.org
+1 717-651-0522