NEMI Tin Whisker Accelerated Test Project Plans Meeting at APEX

Full-Day Session to Review Project Work and User
Group Activities, Discuss Correlation of Tests to Application Life

Agenda

HERNDON, Va. - March 19, 2003 - The Tin Whisker Accelerated Test Project and Tin Whisker User Group of the National Electronics Manufacturing Initiative (NEMI) will hold an open meeting April 2 in Anaheim, Calif., from 8 a.m. to 5 p.m.. The meeting will be co-located with IPC SMEMA Council's APEX exhibition and conference, with meetings held in the Hilton Anaheim (Santa Monica room), adjacent to the Anaheim Convention Center.

Several topics will be discussed in depth:

Accelerated testing for tin whiskers.

• Whisker definition and inspection protocol.
• Latest reports from JEITA (Japan Electronics and Information Technology Industries Association) and ITRI (International Tin Research Institute in the U.K.).
• Report from the NEMI/NIST/TMS workshop held at the TMS conference March 2.
• Update from fundamentals group on basic understanding of whisker formation.
• Feedback from user group on whisker mitigation for high reliability applications.
• Open discussion regarding how to correlate whisker tests to application life (proof of quality and reliability).

The Tin Whisker Accelerated Test Project is working to identify a test method for predicting tin whiskers. Assuming a test can be identified, the group will collect data based on that method, and promote industry acceptance of the test. Ideally, the identified test method will be released as an IPC/JEDEC standard. Because it is a standards-related effort, this project is open to non-members.

The recently formed Tin Whisker User Group is comprised of large OEMs that produce long-life and high-reliability systems. They are looking into designs for plated components that guard against whisker formation.

About NEMI

The National Electronics Manufacturing Initiative's mission is to facilitate leadership of the North American electronics manufacturing supply chain. Based in Herndon, Va., the industry-led consortium is made up of approximately 65 electronics manufacturers, suppliers, industry associations and consortia, government agencies and universities. NEMI roadmaps the needs of the North American electronics industry, identifies gaps in the technology infrastructure, establishes implementation projects to eliminate these gaps (both business and technical), and stimulates standards activities to speed the introduction of new technologies. The consortium also works with government, universities and other funding agencies to set priorities for future industry needs and R&D initiatives. For additional information about NEMI, visit www.nemi.org.

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For further information:
Cynthia Williams
Director of Communications
207-871-1260
cynthiaw@maine.rr.com.com

AGENDA
NEMI Tin Whisker Accelerated Test Project & User Group
APEX Meeting

Wednesday, April 2 8:00 a.m.-5:00 p.m.
Hilton Anaheim, Santa Monica Room
(adjacent to the Convention Center)

1) Whisker test standardization

• Whisker definition & inspection protocol (Nick Vo, Motorola)
• Phase 2 DOE results (Irina Boguslavsky, NEMI consultant)
• Review the NEMI-recommended whisker tests (results of IPC New Orleans meeting) (Nick Vo)
• Latest JEITA presentation (Ichizo Sakamoto, OMRON, chairman of the JEITA Whisker Testing Method Subcommittee - by telephone)
• Latest ITRI input (Dominic Lodge, Soldertec - by telephone)

2) User group (Richard Coyle, Lucent Technologies)

• Acceptable/recommended finishes
• Mitigation techniques

3) Fundamental/modeling work (Maureen Williams, NIST)

• Bibliography of various reports
• Review NEMI/NIST/TMS meeting (March 2, 2003)

4) Open discussion (all)

• How do we correlate whisker tests to application life (proof of quality & reliability)
• Verify and validate proposed tests
• Perform tests to extended durations (establish end points correlated to growth saturation)
• Utilize fundamental understanding
• Studies to verify mitigation techniques using NEMI-recommended tests

5) Develop action plan to move forward