Newsroom

---

International Test Conference
November 3-5, 2009
Austin Convention Center
Austin, Texas

All files are PDF files

Conference Presentation

Boundary-Scan Adoption - An Industry Snapshot with Emphasis on the Semiconductor Industry, Philip B. Geiger, Dell Inc., and Steve Butkovich, Cisco Systems Inc.   paper    presentation

iNEMI Board & Systems Manufacturing Test TIG Meetings (November 5, 2009)

Session Agenda

BIST Project Working Session, Zoe Conroy (Cisco Systems, Inc.)

Status of Current Board/System Test TIG Projects, JJ Grealish (Intel Corporation)

Boundary Scan Adoption Project Update, Phil Geiger (Dell Inc.)

Functional Test Coverage Project Wrap and Next Steps, Tony Taylor ( Intel Corporation)

Board Flexure Project Working Session, Rosa Reinosa (Hewlett-Packard)

For further information:
David Godlewski
dgodlewski@inemi.org
+1 717-651-0522