Agenda - iNEMI Meetings at OFC/NFOEC 2006 Conference, March 6, 2006, Anaheim Marriott

Industry Collaboration, David Godlewski, iNEMI

Development of Cleanliness Specification for Single-Mode Connectors with 1.25 and 2.5 mm Ferrules, Dr. Tatiana Berdinskikh, Celestica International Inc.; Dr. Sun-Yuan Huang, Intel Corporation; Douglas H. Wilson, PVI Systems Inc.

Gaussian Weighted % Occluded Area and Insertion Loss per Inspection Criteria, Dr. Sun-Yuang Huang, Intel Corporation

Multimode Insertion Loss / Return Loss Testing Process, iNEMI Endface Project Meeting on 3/1/06, David W. Fisher, Tyco Electronics

Loss Correlation Study for Contaminated Multimode Optical Connectors, Steve Lytle, Westover Scientific

The Proposed Cleanliness Specification of STUB Endface - The Dust on Endface Experiment for Receptable Devices, Yutaka Sadohara, Sumitomo Electric Industries, Ltd.

The Investigation of ESD Effects for Mated Fiber Optic Connectors, Dr. T. Berdinskikh and Jeno Chen, Celestica International Inc.; John M. Culbert and Dr. Robert Mays, Jr., Megladon Manufacturing Group, Ltd

Publication of IPC 8497-1, "Cleaning Methods and Contamination Assessment for Optical Assembly," and Future Research Strategy, Dr. Tatiana Berdinskikh, Celestica

iNEMI Optoelectronics TIG, Potential New Projects, Review & Discussion, Tatiana Berdinskikh, Celestica International Inc.; David Godlewski, iNEMI