Workshop Agenda

Introduction:  iNEMI Process & Projects
David Godlewski, iNEMI

Texas Instruments Alliance PDC Campus Review & Genealogy Trace System
Dan Wikander, TI

SMT Reel Labeling Project Overview
Patrick Figueroa, Delphi

Supplier Presentations:

    Code Corporation
    Jim Bagley and Bright Williamson

     Cogiscan, Inc.
     Vincent Dubois and Francois Monette

     Intermec
     Ty Boland and Glenn Aspenns

     Microscan 
     Richard Bellemare and Mike Cizek

NEDA 1D-2D Guidelines (Draft Specifications)

C-9023 Standard
Jeff Tepe, Delphi