"NEMI Technology Roadmaps - What's New for 2002?" Jim McElroy, IPC Committee Luncheon, April 2, 2003.
Spanning the Virtual Factory: Managing Supply Chain Communications (April 1, 2003)
"Product Lifecycle Information Management: Business Trends and Anticipated Technology Needs," Barbara Goldstein, NIST.
"The PDX Standard at Work: A View From the Field," Doug Furbush, Manufacturing Research Center, Georgia Institute of Technology.
"NIST Internet Commerce for Manufacturing Testbed: Exploring Supply Chain Integration in Manufacturing Using E-Commerce Standards and Technologies," John Messina, NIST.
NEMI Test Strategy Project Forum (April 1, 2003)
"Test Strategy Project - Introduction," David Mendez, Solectron Corporation.
"Project 1 - Test Coverage Analysis," Stig Oresjo, Agilent Technologies.
"Project 3 - Test Cost Model," Rosa Reinosa and Carlos Michel, Hewlett-Packard (presented by Amit Verma, Teradyne).
Test Strategy Cost Model (Rev 1.0)
Other Meetings and Presentations at APEX
Product Lifecycle Information Management (PLIM) gap analysis meeting
Board Assembly gap analysis meeting
Flip Chip & CSP Underfill
"Recrystallization Principles Applied to Whisker Growth in Tin," Dr. Irina Boguslavsky, NEMI consultant, and Peter Bush, SUNY Buffalo, APEX conference, March 31, 2003, Anaheim, California.