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Reliability Methodology for Substrates

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Problem statement

  • A number of alternative packaging technologies, each covered by different specifications and reliability requirements are currently being used in Multichip packaging such as POP

  • These specifications and requirements are also a function of market segment and OEM requirements

  • This effort looks to develop an alternative approach to develop realistic requirements and specifications which benefit the entire supply chain

  • Pick a market segment and/or product line as a pilot vehicle

  • The scope of this first initiative should focus on one package type identified by the team

Objectives

  • Cover details of reliability specs – life cycle, thermal cycles, shock test, etc.

  • Good potential research cooperative project with universities

  • OEMs to provide detailed specifications/requirements – mechanical and electrical

  • Substrate suppliers to provide material properties early to support OEM simulations

  • May require that new metrology be developed to support the reliability model

  • New acceleration methods are highly desirable to shrink TTM

  • Define interfacial & chemical properties – define metrology requirements and methods

Expected output

  • Improved reliability specifications that focus on reliability issues of current technology rather than previous technology; thus improving reliability and reducing cost
  • An industry wide consolidation of reliability specifications

Click here for more information about other Organic Packaging Substrates Initiatives.

Further information

Jim Arnold (North America)
Tel: +1 480-854-0906
Mobile: +1 480-703-0133
jim.arnold@inemi.org

Haley Fu (Asia)
+86 21 5835 3839
haley.fu@inemi.org