End-of-Project Webinar:  iNEMI Medical Reliability for MLCCs (Multi-Layer Ceramic Capacitors) Project (March 31, 2010)

"Failure Mechanisms, Acceptance Criteria and Accelerated Test Procedures for Electronic Components Used in Active Implantable Medical Devices:  Capacitors," presented at 2009 Medical Electronics Symposium, by Grady White (NIST) (Tempe, Arizona) (September 17, 2009).  Click here for the abstract.

The goal of the project is the determination of accelerated life test methods of long term leakage and break down failures of MLCCs.  The work is a continuation of Phase 1.  Specific deliverables of Phase II include the following:

• Creation of a test vehicle for use in long term life and accelerated testing of MLCC components
• Design of test board
• Fabrication of test vehicle
• Population of test board with functional MLCCs
• Creation of fixtures and test equipment cables and peripherals at NIST
• Testing of DOE variables from Phase I at NIST Boulder Facility
• Completion of screening experiments at NIST
• Collection of data and data mining resulting failures for trends and insight
• Failure analysis of test output “Failures as defined in Phase I”
• NIST to coordinate FA with Suppliers
• Phase II Report 
  

Statement of Work (Version 4.0, June 16, 2008)

Project Statement (Version 1.0, June 16, 2008) (Sign up ends on Friday, August 29, 2008)

Presentations:  iNEMI Medical TIG Forum, hosted by FDA (November 14, 2008)