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Projects
Structural Test of External Memory Devices Project
(Boundary Scan Adoption Project, Phase 2)


Chair: 
Phil Geiger (Dell)
Co-Chair:  Steve Butkovich (Cisco Systems)

Click here for telecon information

Project objective
This new initiative will evaluate potential solutions to issues related to memory device testing to identify what the current and future industry best practices are.

Steps for joining the project
On July 16, 2010, the iNEMI Technical Committee approved the SOW and Project Statement, thus beginning the corporate sign-up period for this project.  The project will officially begin as soon as two iNEMI members sign the project statement. The period for becoming a founding member for this project will close on September 10, 2010.

      For iNEMI members:

  • Complete and sign the project statement
  • Fax the completed statement(s) to +1 (703) 834-2735 or scan and email to infohelp@inemi.org

      For non-members:

Statement of Work and Project Statement (PDF files)

Statement of Work (Version 2.1, July 16, 2010)

Project Statement (Version 1.1, July 16, 2010 (initial sign up ends September 10, 2010)


Click here for information about Boundary Scan Adoption Project - Phase 1


For additional information
David Godlewski
+1 717-651-0522
dgodlewski@inemi.org