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Test TIG

Chair: Rosa Reinosa (Hewlett-Packard)
Co-chair: JJ Grealish (Intel Corporation)

New initiatives:
- Board Flexure Standardization Project, Phase 2 (sign up now through September 10)
- Boundary Scan Adoption, Phase 2 - Structural Test of Memory Devices Project (sign up now through September 10)
- Built-In Self-Test
- Test Strategy Model Update

Completed projects:

- Board Flexure Standardization Project
- Boundary Scan Adoption Project
- Functional Test Coverage Assessment Project


Presentations:  iNEMI Test TIG Meetings, held at APEX (October 8, 2010; Las Vegas, Nevada)

Presentations:  iNEMI Board & Systems Manufacturing Test TIG Meetings, held at International Test Conference (November 5, 2009; Austin, Texas)

Presentations:  TIG and project meetings held at IPC Circuits Expo, APEX and the Designers Summit (April 1, 2008; Las Vegas, Nevada)